Automatic optical inspection systems (AOI) in filter production - Your chance for higher quality and cost saving
As quality requirements for filter media increase, producers need quality control systems that meet these stricter requirements while also remaining economical. New developments for Automatic Optical Inspection systems (AOI) can provide a combination of local defect and overall properties monitoring, thus keeping investment down, optimizing quality control and reducing production cost. Modern AOI systems feature:
- ABI – Adaptive Background Illumination:
Adaptive Background illumination for varying materials eliminates most of the inherent material noise, making even smallest defects visible.
- Virtual X-Ray:
Multiplexed switching of standard and high light intensity in a transmission illumination setup generates images similar to X-ray images, showing inclusions and foreign particles in filter media very clearly.
- Fold Detection:
Up to now optical inspection systems had difficulties detecting folds and wrinkles in filter materials, especially when those defects are small and oriented in transport direction. New illumination technologies overcome this constraint.
- Surface Analysis:
Today the evaluation of surface gloss or roughness is commonly based on spot measurements taken with dedicated sensors (most commonly handheld units). Using the same cameras as already applied for the detection of local defects, AOI systems can also evaluate these overall properties - not only for single spots but over the whole surface of the filter material.
- Formation Analysis:
Homogeneity of the filter media has substantial influence on the function of the final product. Modern AOI systems provide the tools to evaluate material properties, such as grammage, cloudiness and homogeneity, in CD- and MD-direction.
The presentation will show examples of these new features’ abilities. It will also show how AOI systems help to control and qualify the function of the final product prior to its delivery to the customer.
Session: F3 - Filter Media - Quality Control and Pore Size Analysis III
Learn more at FILTECH 2018 - Register Now!
Day: 13 March 2018
Time: 16:45 - 18:00 h