Combined small angle X-ray scattering and transmission X-ray analysis

M. Meier*, J. Ungerer, M. Klinge, H. Nirschl, Karlsruhe Institute of Technology (KIT), Germany

The in-house developed laboratory-scaled small angle X-ray scattering (SAXS) device of the Institute for Mechanical Process Engineering and Mechanics at the Karlsruhe Institute of Technology has been successfully used to analyze the properties of nanostructured particle systems. The physical mechanism of SAXS enables a deeper understanding of the properties of particles provided as suspensions or powders. Moreover, a wide range of information, e.g. primary particle and aggregate sizes as well as mass and surface fractal dimensions, can be obtained simultaneously by one measurement.

Whereas the analysis of the scattering data is a proved method to characterize nanometric materials, the analysis of an X-ray beam transmission profiles enables new possibilities for the sediment characterization. The transmission of the X-ray beam only depends on the local density of the sample and hence does not, like for instance visible light, depend on the refractive index. This difference enables the analysis of cloudy or dark samples as well as suspensions with particles having a refractive index very close to the continuous phase.

In this contribution the experimental setup of a combined small angle X-ray scattering and transmission X-ray analysis will be presented in detail. Samples having a wide range of different properties (e.g. organic or inorganic, compressibility, shape or crystallinity) were analyzed. Changes in the density distribution dependent on the sediment height for the different particle systems were investigated by X-ray transmission and the height dependent primary particle structure was measured by combined SAXS measurement, e.g. for crystals of amino acids...

Session: L4 - Cake Filtration - Particle Properties and Analysis
Day: 14 March 2018
Time: 09:00 - 10:15 h

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