Optical quality control of filter media: MIDA X makes hidden defects visible
- Defect detection with muliple images (MIDA) ensures all local defects are caught
- Visual intelligence: MIDA X (MIDA next generation) ensures optimum classification of detected defects
- With simultaneous properties monitoring complete quality control with insight into production performance is achieved
- Smart Factory: Optical Inspection Systems allow deep insight into production performance, rendering it an important contributor to Big Data.
Session: F4 - Quality Control and Pore Size Analysis of Filter Media
Learn more at FILTECH 2019 - Register Now!
Day: 23 October 2019
Time: 09:00 - 10:15 h