Optical quality control of filter media: MIDA X makes hidden defects visible
Publisher FILTECH
H. Oerley*, Dr. Schenk GmbH, Germany
- Defect detection with muliple images (MIDA) ensures all local defects are caught
- Visual intelligence: MIDA X (MIDA next generation) ensures optimum classification of detected defects
- With simultaneous properties monitoring complete quality control with insight into production performance is achieved
- Smart Factory: Optical Inspection Systems allow deep insight into production performance, rendering it an important contributor to Big Data.
Published in: FILTECH 2019 Conference
Date of Conference: -
DOI: -
Presenter's Affiliation: Dr. Schenk
Publisher: FILTECH Exhibitions GmbH & Co. KG
Country: Germany
Electronic ISBN: 978-3-941655-16-4
Conference Location: Cologne, Germany
Keywords: Filter Test Equipment, Nonwovens, Online Monitoring, Particle Detection, Quality Control, Media Characterization, Media Properties